PINKY KUMARI; CHEEKIRI VENKATA MURALI KRISHNA; BALIJABUDDA CHARAN. A Forensic Approach to Image Clone Detection Using Structural Similarity Index (SSIM) and Error Level Analysis (ELA). International Journal of Innovations in Science Engineering And Management, India, v. 5, n. 3, p. 72–83, 2026. DOI: 10.69968/ijisem.2026v5i372-83. Disponível em: https://www.ijisem.com/journal/index.php/ijisem/article/view/623. Acesso em: 2 nov. 2026.